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Admin (discuție | contribuții) (Pagină nouă: Pagina dedicata companiei FormFactor Inc listata cu simbolul US.FORM ==Descriere companie== FormFactor, Inc. (https://www.formfactor.com/) is a provider of test and measurement technologies. The Company operates through two segments: Probe Cards segment and the Systems segment. Probe Cards segment consists of probe card products and analytical probes. The Systems segment consists of probe stations, metrology systems, and thermal and cryogenic systems. Its probe cards utilize...) |
(The LinkTitles extension automatically added links to existing pages (https://github.com/bovender/LinkTitles).) |
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==Descriere companie== | ==Descriere companie== | ||
FormFactor, Inc. (https://www.formfactor.com/) is a provider of test and measurement technologies. The Company operates through two segments: Probe Cards segment and the Systems segment. Probe Cards segment consists of probe card products and analytical probes. The Systems segment consists of probe stations, metrology systems, and thermal and cryogenic systems. Its probe cards utilize a variety of technologies and product architectures, including micro-electromechanical systems (MEMS) technologies. Analytical probes are used for a diverse set of applications, including device characterization, electrical simulation model development, failure analysis, and prototype design debugging. Probe stations, also referred to as probing systems, are a critical tool for the development of semiconductor and electro-optical processes and designs. It offers surface metrology systems for various applications including the development, production, and quality control of semiconductor products. | FormFactor, Inc. (https://www.formfactor.com/) is a provider of [[test]] and measurement technologies. The Company operates through two segments: Probe Cards segment and the Systems segment. Probe Cards segment consists of probe card products and analytical probes. The Systems segment consists of probe stations, metrology systems, and thermal and cryogenic systems. Its probe cards utilize a variety of technologies and product architectures, including micro-electromechanical systems (MEMS) technologies. Analytical probes are used for a diverse set of applications, including device characterization, electrical simulation model development, failure analysis, and prototype design debugging. Probe stations, also referred to as probing systems, are a critical tool for the development of semiconductor and electro-optical processes and designs. It offers surface metrology systems for various applications including the development, production, and quality control of semiconductor products. | ||
==Grafic actiuni companie== | ==Grafic actiuni companie== | ||