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(Pagină nouă: Pagina dedicata companiei AEHR TEST SYSTEMS listata cu simbolul US.AEHR ==Descriere companie== Aehr Test Systems (https://www.aehr.com/) is engaged in the designing, engineering and manufacturing of test and burn-in equipment used in the semiconductor industry. The Company manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures and related accessories. The Company’s principal products are the Advanced Burn-In and Test System (AB...)
 
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==Descriere companie==
==Descriere companie==
Aehr Test Systems (https://www.aehr.com/) is engaged in the designing, engineering and manufacturing of test and burn-in equipment used in the semiconductor industry. The Company manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures and related accessories. The Company’s principal products are the Advanced Burn-In and Test System (ABTS), the FOX full wafer contact parallel test and burn-in systems, the MAX burn-in system, the WaferPak full wafer contactor, the DiePak carrier and test fixtures. It develops, manufactures and sell systems, which are designed to perform reliability screening and stress testing, burn-in or cycling, of homogeneous and heterogenous logic and memory integrated circuits (ICs) sensors and optical devices. These systems can be used to simultaneously perform parallel testing and burn-in of packaged ICs, singulated bare die or ICs still in wafer form.
Aehr [[Test]] Systems (https://www.aehr.com/) is engaged in the designing, engineering and manufacturing of test and burn-in equipment used in the semiconductor industry. The Company manufactures and markets full wafer contact test systems, test during burn-in systems, test fixtures and related accessories. The Company’s principal products are the Advanced Burn-In and Test System (ABTS), the FOX full wafer contact parallel test and burn-in systems, the MAX burn-in system, the WaferPak full wafer contactor, the DiePak carrier and test fixtures. It develops, manufactures and sell systems, which are designed to perform reliability screening and stress testing, burn-in or cycling, of homogeneous and heterogenous logic and memory integrated circuits (ICs) sensors and optical devices. These systems can be used to simultaneously perform parallel testing and burn-in of packaged ICs, singulated bare die or ICs still in wafer form.


==Grafic actiuni companie==
==Grafic actiuni companie==
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